W-Cu/AlN Composite XRD Analysis

XRD (X-ray Diffraction), we can obtain the content, the structure or shape of internal atom or molecule by analyzing the spectrum. X-ray is a very short wavelength (about 20 ~ 0.06 angstroms) of electromagnetic waves, can penetrate a certain thickness of the material, and can make fluorescent substances, photographic emulsion photosensitive, gas ionization. In X-rays generated by electron beam bombardment of metal "target", X-rays having specific wavelengths corresponding to various elements in the target are referred to as characteristic (or identified) X-rays.

Compared with the XRD spectrum of W-Cu and W-Cu/AlN after hot pressing sintering, we can found that W, Cu diffraction peak intensity was significantly increased, the width narrowed, which indicates W and Cu particle grows up in the sintering process. After sintering under the same conditions, the diffraction peak intensity of W and Cu in the sintered body added with nano-AlN particles is lower than that of the sintered body without AlN particles added. It is reason that Nano crystalline AlN particles can effectively inhibit the growth of W and Cu grains during sintering. Therefore, nano AlN can further promote the structure characteristic of W-Cu composite materials and effectively reduce the particle size through XRD analysis.

tungsten copper product picturetungsten copper product picture

Any feendback or inquiry of Tungsten Copper Alloy Products please feel free to contact us:
Email: sales@chinatungsten.com
Tel.: +86 592 512 9696 ; +86 592 512 9595
Fax.: +86 592 512 9797

More Info:  Tungsten Copper   Tungsten Copper Alloy